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Volumn 45, Issue 11, 2000, Pages 3489-3508
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Analytic method based on identification of ellipse parameters for scanner calibration in cone-beam tomography
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTIC METHOD;
ARTICLE;
CALCULATION;
CALIBRATION;
COMPUTED TOMOGRAPHY SCANNER;
GEOMETRY;
PRIORITY JOURNAL;
SINGLE PHOTON EMISSION COMPUTER TOMOGRAPHY;
X RAY;
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EID: 0033781494
PISSN: 00319155
EISSN: None
Source Type: Journal
DOI: 10.1088/0031-9155/45/11/327 Document Type: Article |
Times cited : (230)
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References (20)
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