Progress and research at the Shanghai EBIT

Canadian Journal of Physics

Volumn 86, Issue 1, 2008, Pages 321-325

  Hu, Wei ^a   Fu, Yunqing ^a   Gong, Peirong ^b   Yao, Ke ^a   Lu, Di ^a   Chen, Weidong ^a   Liu, Yong ^a   Yang, ^a   Xiao, Jun ^a   Wu, Shimin ^a   Geng, Zhixian ^a   Huang, Min ^a   Zhang, Xuemei ^a   Hutton, Roger ^a   Liljeby, Leif ^c   He, Mianhong ^a   Zou, Yarning ^a  

^a FUDAN UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

^c MANNE SIEGBAHN LABORATORY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

IONS; MEASUREMENT THEORY; PARAMETER ESTIMATION; X RAY ANALYSIS; XENON;

DI-ELECTRONIC RECOMBINATION MEASUREMENTS; XENON X-RAY EMISSION LINES;

ELECTRON BEAMS;

EID: 41549089121     PISSN: 00084204     EISSN: None     Source Type: Journal    
DOI: 10.1139/P07-161     Document Type: Conference Paper

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