Status of the Shanghai EBIT

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 235, Issue 1-4, 2005, Pages 509-513

  Zhu, Xiaofeng ^a   Liu, Yong ^a   Wang, Xincheng ^a   Liu, Yafeng ^a   Guo, Panlin ^b   Lu, Di ^a   Zhang, Xuemei ^a   Hu, Wei ^a   He, Mianhong ^a   Liljeby, Leif ^c   Zou, Yaming ^a  

^a FUDAN UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF APPLIED PHYSICS   (China)

^c MANNE SIEGBAHN LABORATORY   (Sweden)

Author keywords

EBIT

Indexed keywords

CATHODES; COMPUTER SIMULATION; CURRENT DENSITY; ELECTRIC FIELDS; ELECTRIC POTENTIAL; ELECTRON BEAMS; ELECTRON GUNS; IONIZATION; IONS; MAGNETIC FIELDS; OPTIMIZATION; SUPERCONDUCTING DEVICES;

ELECTRON BEAM ION TRAPS (EBIT); ELECTROSTATIC POTENTIALS; HELMHOLTZ COILS; HIGHLY CHARGED IONS (HCI);

ELECTRON TRAPS;

EID: 20144378104     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2005.03.234     Document Type: Conference Paper

References (7)

1. M.A. Levine, R.E. Marrs, J.R. Henderson, D.A. Knapp, and M.B. Schneider Phys. Scr. T 22 1988 157
2. J.D. Silver, A.J. Varney, H.S. Margolis, P.G.E. Barid, I.P. Grant, P.D. Groves, W.A. Hallet, A.T. Handfort, P.J. Hirst, and A.R. Holmes Rev. Sci. Instr. 65 1994 1072
3. C.A. Morgan, F.G. Serpa, E. Takacs, E.S. Meyer, J.D. Gillaspy, J. Sugar, J.R. Roberts, C.M. Brown, and U. Feldman Phys. Rev. Lett. 74 1994 1072
4. F.J. Currell, J. Asada, K. Ishii, A. Minoh, K. Motohashi, N. Nakamura, K. Nishizawa, S. Ohtani, K. Okazaki, and M. Sakurai J. Phys. Soc. Jpn. 65 1996 3186
5. C. Biedermann, A. Forster, G. Fußmann, and R. Radtke Phys. Scr. T 73 1997 360
6. J.R. Crespo, A. Dorn, R. Moshammer, and J. Ullrich Phys. Scr. T 80 1999 502
7. V.P. Ovsyannikov, and G.Z. Lornack Rev. Sci. Instr. 70 1999 2646