Radiation coupling and image formation in scanning near-field optical microscopy

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 161-167

  Pohl, D W ^a   Novotny, L ^b   Hecht, B ^a   Heinzelmann, H ^c  

^a IBM RESEARCH ZURICH   (Switzerland)

^b ETH ZURICH   (Switzerland)

^c UNIVERSITY OF BASEL   (Switzerland)

Author keywords

Nanostructures; Optical properties

Indexed keywords

CALCULATIONS; ELECTROMAGNETIC FIELDS; LIGHT PROPAGATION; MICROSCOPES; NANOSTRUCTURED MATERIALS; OPTICAL PROPERTIES; OPTIMIZATION; RADIATION; SUBSTRATES;

APERTURE NEAR FIELD PROBES; IMAGE FORMATION; LIGHT FLUX; MULTIPLE MULTIPOLE METHOD; RADIATION COUPLING; SCANNING NEAR FIELD OPTICAL MICROSCOPY;

OPTICAL MICROSCOPY;

EID: 0030079217     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06810-4     Document Type: Article

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