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Volumn 56, Issue 10, 2000, Pages 1312-1315
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The oversampling phasing method
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
CONFORMATION;
IMAGE PROCESSING;
METHODOLOGY;
SCANNING ELECTRON MICROSCOPY;
SENSITIVITY AND SPECIFICITY;
X RAY DIFFRACTION;
IMAGE PROCESSING, COMPUTER-ASSISTED;
MICROSCOPY, ELECTRON, SCANNING;
MOLECULAR CONFORMATION;
SENSITIVITY AND SPECIFICITY;
SUPPORT, U.S. GOV'T, NON-P.H.S.;
X-RAY DIFFRACTION;
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EID: 0033781131
PISSN: 09074449
EISSN: None
Source Type: Journal
DOI: 10.1107/S0907444900008970 Document Type: Article |
Times cited : (107)
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References (13)
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