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Volumn 56, Issue 10, 2000, Pages 1312-1315

The oversampling phasing method

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CONFORMATION; IMAGE PROCESSING; METHODOLOGY; SCANNING ELECTRON MICROSCOPY; SENSITIVITY AND SPECIFICITY; X RAY DIFFRACTION;

EID: 0033781131     PISSN: 09074449     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0907444900008970     Document Type: Article
Times cited : (107)

References (13)
  • 10
    • 0002392403 scopus 로고
    • Imaging Processes and Coherence in Physics. Springer Lecture Notes in Physics, Vol. 112, edited by M. Schlenker, Berlin: Springer
    • (1980) , pp. 229-235
    • Sayre, D.1
  • 11
    • 0007499246 scopus 로고
    • Direct Methods of Solving Crystal Structure, edited by H. Schenk. NATO ASI Series B (Physics), Vol. 274. New York: Plenum Press
    • (1991) , pp. 353-356
    • Sayre, D.1
  • 12
    • 0003855432 scopus 로고    scopus 로고
    • X-ray Microscopy and Spectromicroscopy, edited by J. Thieme, G. Schmahl, D. Rudolph and E. Umbach. Berlin: Springer-Verlag
    • (1998) , pp. 25-34
    • Schneider, G.1    Niemann, B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.