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Volumn 2008, Issue , 2008, Pages

Fabric defect detection using modified local binary patterns

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATION THEORY; FEATURE EXTRACTION; IMAGE CLASSIFICATION; PIXELS; VECTORS;

EID: 41249092741     PISSN: 16876172     EISSN: 16876180     Source Type: Journal    
DOI: 10.1155/2008/783898     Document Type: Article
Times cited : (130)

References (30)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.