Defect detection in textured materials using optimized filters

IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics

Volumn 32, Issue 5, 2002, Pages 553-570

  Kumar, Ajay ^a,b   Pang, Grantham K H ^a,c  

^a IEEE   (Hong Kong)

^b HONG KONG UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Hong Kong)

^c UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Defect detection; Industrial inspection; Optimized FIR filters; Performance evaluation; Quality assurance; Textured defects

Indexed keywords

DEFECT DETECTION; OPTIMIZED FILTERS;

IIR FILTERS; INSPECTION; PERFORMANCE; QUALITY ASSURANCE;

FIR FILTERS;

EID: 0036792668     PISSN: 10834419     EISSN: None     Source Type: Journal    
DOI: 10.1109/TSMCB.2002.1033176     Document Type: Article

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