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Volumn 109, Issue 2-3, 2008, Pages 360-364
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Mechanical properties of InGaN thin films deposited by metal-organic chemical vapor deposition
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Author keywords
InGaN; MOCVD; Nanoindentation; XRD
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Indexed keywords
INDIUM COMPOUNDS;
MECHANICAL PROPERTIES;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
SCANNING PROBE MICROSCOPY;
X RAY DIFFRACTION ANALYSIS;
DEPOSITION TEMPERATURES;
INGAN THIN FILMS;
LATTICE FRICTION STRESS;
THIN FILMS;
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EID: 41249092406
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2007.12.007 Document Type: Article |
Times cited : (21)
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References (18)
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