Laser-diode-stimulated emission depletion microscopy

Applied Physics Letters

Volumn 82, Issue 18, 2003, Pages 3125-3127

  Westphal, V ^a   Blanca, C M ^a   Dyba, M ^a   Kastrup, L ^a   Hell, S W ^a  

^a MAX PLANCK INSTITUTE FOR BIOPHYSICAL CHEMISTRY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION; FLUORESCENCE; LASER PULSES; MICROSCOPIC EXAMINATION; SEMICONDUCTOR LASERS;

FAR-FIELD FLUORESCENCE MICROSCOPY;

STIMULATED EMISSION;

EID: 0038528148     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1571656     Document Type: Article

References (4)

1. S. W. Hell and J. Wichmann, Opt. Lett. 19, 780 (1994).
2. T. A. Klar, E. Engel, and S. W. Hell, Phys. Rev. E 64, 066613 (2001).
3. C.-Y. Dong, C. Buehler, P. T. C. So, T. French, and E. Gratton, Appl. Opt. 40, 1109 (2001).
4. M. Schrader, F. Meinecke, K. Bahlmann, M. Kroug, C. Cremer, E. Soini, and S. W. Hell, Bioimaging 3, 147 (1995).