Subwavelength imaging with anisotropic structure comprising alternately layered metal and dielectric films

Optics Express

Volumn 16, Issue 6, 2008, Pages 4217-4227

  Wang, Changtao ^a   Zhao, Yanhui ^a   Gan, Dachun ^a   Du, Chunlei ^a   Luo, Xiangang ^a  

^a INSTITUTE OF OPTICS AND ELECTRONICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; NUMERICAL METHODS; PERMITTIVITY; WAVELENGTH;

METALLODIELECTRIC FILMS; SUBWAVELENGTH IMAGING;

IMAGING SYSTEMS;

METAL;

ALGORITHM; ANISOTROPY; ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; COMPUTER SIMULATION; METHODOLOGY; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTY; THEORETICAL MODEL;

ALGORITHMS; ANISOTROPY; COMPUTER SIMULATION; MEMBRANES, ARTIFICIAL; METALS; MODELS, THEORETICAL; REFRACTOMETRY; SURFACE PLASMON RESONANCE; SURFACE PROPERTIES;

EID: 41149161526     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.16.004217     Document Type: Article

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