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Volumn 3, Issue 4, 2006, Pages 527-544

Atomic force microscope-based nanomanipulation with drift compensation

Author keywords

Atomic force microscope; Drift compensation; Nanomanipulation; Neural network controller

Indexed keywords

ADAPTIVE ALGORITHMS; APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; CLOSED LOOP CONTROL SYSTEMS; ERROR ANALYSIS; NEURAL NETWORKS;

EID: 33845738742     PISSN: 14757435     EISSN: None     Source Type: Journal    
DOI: 10.1504/IJNT.2006.011177     Document Type: Article
Times cited : (17)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.