-
2
-
-
0001411541
-
Ionization energy of acceptors in As-doped HgCdTe grown by molecular beam epitaxy
-
Shi X H, Rujirawat S, Ashokan R, et al. Ionization energy of acceptors in As-doped HgCdTe grown by molecular beam epitaxy [J]. Appl. Phys. Lett. 1998, 73, 638.
-
(1998)
Appl. Phys. Lett.
, vol.73
, pp. 638
-
-
Shi, X.H.1
Rujirawat, S.2
Ashokan, R.3
-
4
-
-
3042754212
-
Infrared photoreflectance of InAs
-
Swartz C H, Tompkins R P, Giles N C, et al. Infrared photoreflectance of InAs [J]. J. Electronic Mat. 2004, 33, 728.
-
(2004)
J. Electronic Mat.
, vol.33
, pp. 728
-
-
Swartz, C.H.1
Tompkins, R.P.2
Giles, N.C.3
-
5
-
-
34249856091
-
Parameters extraction from the dark current characteristics of long-wavelength HgCdTe photodiode
-
QUAN Zhi-Jue, LI Zhi-Feng, HU Wei-Da, et al. Parameters extraction from the dark current characteristics of long-wavelength HgCdTe photodiode [J]. J. Infrared Millim, 2007, 26(2): 92.
-
(2007)
J. Infrared Millim
, vol.26
, Issue.2
, pp. 92
-
-
Quan, Z.-J.1
Li, Z.-F.2
Hu, W.-D.3
-
6
-
-
34547299641
-
Numerical modeling of middle wavelength two color photovoltaic HgCdTe Detectors
-
XU Xiang-Yan, YE Zheng-Hua, LI Zhi-Feng, et al. Numerical modeling of middle wavelength two color photovoltaic HgCdTe Detectors [J]. J. Infrared Millim. Waves, 2007, 26(3): 164.
-
(2007)
J. Infrared Millim. Waves
, vol.26
, Issue.3
, pp. 164
-
-
Xu, X.-Y.1
Ye, Z.-H.2
Li, Z.-F.3
-
8
-
-
0010404707
-
Pollak, New normalization procedure for modulation spectroscopy
-
Shen H, Parayanthal P, Liu Y F, et al. Pollak, New normalization procedure for modulation spectroscopy [J]. Rev. Sci. Instrum. 1987, 58, 1429.
-
(1987)
Rev. Sci. Instrum.
, vol.58
, pp. 1429
-
-
Shen, H.1
Parayanthal, P.2
Liu, Y.F.3
-
9
-
-
0027677195
-
Modulation spectroscopy of semiconductors: Bulk/thin film, microstructures, surfaces/interfaces and devices
-
Pollak F H, Shen H. Modulation spectroscopy of semiconductors: bulk/thin film, microstructures, surfaces/interfaces and devices [J]. Mater. Sci. Eng. 1993, 10, 275.
-
(1993)
Mater. Sci. Eng.
, vol.10
, pp. 275
-
-
Pollak, F.H.1
Shen, H.2
-
10
-
-
0001158119
-
1-xAs/GaAs/AlAs microcavity vertical-cavity surface emitting laser structures in the weak-coupling regime: The cavity/ground-state-exciton resonance
-
1-xAs/GaAs/AlAs microcavity vertical-cavity surface emitting laser structures in the weak-coupling regime: The cavity/ground-state-exciton resonance [J]. Phys. Rev. B, 1999, 59, 2894.
-
(1999)
Phys. Rev. B
, vol.59
, pp. 2894
-
-
Klar, P.J.1
Rowland, G.2
Thomas, P.J.S.3
-
12
-
-
4043176238
-
Photoreflectance investigations of the energy level structure in GaIn-NAs-based quantum wells
-
Misiewicz J, Kudrawiec R, Ryczko K, et al, Photoreflectance investigations of the energy level structure in GaIn-NAs-based quantum wells [J]. J. Phys.: Condens. Matter, 2004, 16, S3071.
-
(2004)
J. Phys.: Condens. Matter
, vol.16
-
-
Misiewicz, J.1
Kudrawiec, R.2
Ryczko, K.3
-
13
-
-
33748880318
-
1-xP quantum wells with CuPt-type long-range ordering
-
1-xP quantum wells with CuPt-type long-range ordering [J]. J. Appl. Phys. 2006, 100, 053522.
-
(2006)
J. Appl. Phys.
, vol.100
, pp. 053522
-
-
Shao, J.1
Lu, X.2
Yue, F.3
-
14
-
-
33745714525
-
Modulated photoluminescence spectroscopy with a step-scan Fourier transform infrared spectrometer
-
Shao J, Lu W, Lu X, et al. Modulated photoluminescence spectroscopy with a step-scan Fourier transform infrared spectrometer [J]. Rev. Sci. Instrum. 2006, 77, 063104.
-
(2006)
Rev. Sci. Instrum.
, vol.77
, pp. 063104
-
-
Shao, J.1
Lu, W.2
Lu, X.3
-
15
-
-
25444447390
-
A new Fourier transform photo-modulation spectroscopic technique for narrow band-gap materials in the mid-to far-infra-red
-
Hosea T J C, Merrick M, Murdin B N. A new Fourier transform photo-modulation spectroscopic technique for narrow band-gap materials in the mid-to far-infra-red [J]. Phys. Stat. Sol. (a), 2005, 202, 1233.
-
(2005)
Phys. Stat. Sol. (a)
, vol.202
, pp. 1233
-
-
Hosea, T.J.C.1
Merrick, M.2
Murdin, B.N.3
-
16
-
-
33750739798
-
Photomodulated infrared spectroscopy by a step-scan Fourier transform infrared spectrometer
-
Shao J, Yue F, Lu X, et al. Photomodulated infrared spectroscopy by a step-scan Fourier transform infrared spectrometer [J]. Appl. Phys. Lett. 2006, 89, 182121.
-
(2006)
Appl. Phys. Lett.
, vol.89
, pp. 182121
-
-
Shao, J.1
Yue, F.2
Lu, X.3
-
17
-
-
0030110329
-
Fourier transform spectroscopy applied to photoluminescence: Advantages and warnings
-
Bignazzi A, Grilli E, Radice M, et al. Fourier transform spectroscopy applied to photoluminescence: Advantages and warnings [J]. Rev. Sci. Instrum. 1996, 67, 666.
-
(1996)
Rev. Sci. Instrum.
, vol.67
, pp. 666
-
-
Bignazzi, A.1
Grilli, E.2
Radice, M.3
-
20
-
-
0042048988
-
Photoluminescence of infrared-sensing materials using an FTIR spectrometer
-
Reisinger A R, Roberts R N, Chinn S R, et al. Photoluminescence of infrared-sensing materials using an FTIR spectrometer [J]. Rev. Sci. Instrum. 1989, 60, 82.
-
(1989)
Rev. Sci. Instrum.
, vol.60
, pp. 82
-
-
Reisinger, A.R.1
Roberts, R.N.2
Chinn, S.R.3
-
21
-
-
85075401652
-
Double modulation techniques in Fourier transform infrared photoluminescence
-
Fuchs F, Lusson A, Wagner J, et al. Double modulation techniques in Fourier transform infrared photoluminescence [J]. Proc. SPIE, 1989, 1145, 323.
-
(1989)
Proc. SPIE
, vol.1145
, pp. 323
-
-
Fuchs, F.1
Lusson, A.2
Wagner, J.3
-
22
-
-
0030315285
-
Photoluminescence investigation on impurity behavior in Sb-doped HgCdTe
-
Chang Y, Chu J H, Tang W G, et al. Photoluminescence investigation on impurity behavior in Sb-doped HgCdTe [J]. Infrared Phys. Technol., 1996, 37, 747.
-
(1996)
Infrared Phys. Technol.
, vol.37
, pp. 747
-
-
Chang, Y.1
Chu, J.H.2
Tang, W.G.3
-
24
-
-
0039746442
-
Infrared photoreflectance of InAs
-
Lin C H, Singer K E, Evans-Freeman J H, et al. Infrared photoreflectance of InAs [J]. Semicond. Sci. Technol. 1997, 12, 1619.
-
(1997)
Semicond. Sci. Technol.
, vol.12
, pp. 1619
-
-
Lin, C.H.1
Singer, K.E.2
Evans-Freeman, J.H.3
-
25
-
-
0034670923
-
1-y/GaSb (0.07 < ∼x < ∼0. 22, 0.05 < ∼y < ∼0.19) quaternary alloys using infrared photoreflectance
-
1-y/GaSb (0.07 < ∼x < ∼0. 22, 0.05 < ∼y < ∼0.19) quaternary alloys using infrared photoreflectance [J]. Phys. Rev. B, 2000, 62, 16600.
-
(2000)
Phys. Rev. B
, vol.62
, pp. 16600
-
-
Mufioz, M.1
Pollak, F.H.2
-
26
-
-
34047166843
-
Photoreflectance spectroscopy with a step-scan Fourier-transform infrared spectrometer: Technique and applications
-
Shao J, Lu W, Yue F, et al. Photoreflectance spectroscopy with a step-scan Fourier-transform infrared spectrometer: Technique and applications [J]. Rev. Sci. Instrum. 2007, 78, 013111.
-
(2007)
Rev. Sci. Instrum.
, vol.78
, pp. 013111
-
-
Shao, J.1
Lu, W.2
Yue, F.3
-
30
-
-
0039154019
-
Sweeping photoreflectance spectroscopy of semiconductors
-
Shen H, Dutta M. Sweeping photoreflectance spectroscopy of semiconductors [J]. Appl. Phys. Lett. 1990, 57, 587.
-
(1990)
Appl. Phys. Lett.
, vol.57
, pp. 587
-
-
Shen, H.1
Dutta, M.2
-
31
-
-
0028443399
-
A new offset technique for suppression of spurious signals in photoreflectance spectra
-
Yan D, Qiang H, Pollak F H. A new offset technique for suppression of spurious signals in photoreflectance spectra [J]. Rev. Sci. Instrum. 1994, 65, 1988.
-
(1994)
Rev. Sci. Instrum.
, vol.65
, pp. 1988
-
-
Yan, D.1
Qiang, H.2
Pollak, F.H.3
-
32
-
-
33749467551
-
Bandgap bowing in InSb1-xNx investigated with a new Fourier transform modulated spectroscopy technique for the mid-infrared
-
Merrick M, Hosea T J C, Murdin B N, et al. Bandgap bowing in InSb1-xNx investigated with a new Fourier transform modulated spectroscopy technique for the mid-infrared [J]. AIP Conf. Proc. 2005, 772: 295-296.
-
(2005)
AIP Conf. Proc.
, vol.772
, pp. 295-296
-
-
Merrick, M.1
Hosea, T.J.C.2
Murdin, B.N.3
|