Ferroelectric and piezoelectric properties of Pb(ZrxTi1 - x)O3 thick films prepared by chemical solution deposition process

Thin Solid Films

Volumn 516, Issue 12, 2008, Pages 4325-4329

  Osone, S ^a   Brinkman, K ^a   Shimojo, Y ^a   Iijima, T ^a  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Atomic force microscopy; X ray diffraction

Indexed keywords

ATOMIC FORCE MICROSCOPY; FERROELECTRIC MATERIALS; X RAY DIFFRACTION; ZIRCONIUM COMPOUNDS;

CHEMICAL SOLUTION DEPOSITION; FERROELECTRIC PROPERTIES;

THICK FILMS;

EID: 40849119727     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.12.108     Document Type: Article

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