Anchoring of sulfur-containing alkylphosphonic and semifluorinated alkylphosphonic molecules on a polycrystalline aluminum substrate

Surface and Interface Analysis

Volumn 40, Issue 2, 2008, Pages 85-96

  Fonder, G ^a   Delhalle, J ^a   Essahli, M ^b,c   Ameduri, B ^b   Mekhalif, Z ^a  

^a UNIVERSITY OF NAMUR   (Belgium)

^b INSTITUT CHARLES GERHARDT   (France)

^c SIDI MOHAMED BEN ABDELLAH UNIVERSITY   (Morocco)

Author keywords

Electrochemical polarization curves; PM IRRAS; Self assembled monolayers; aluminum; Sulfur containing alkylphosphonic acids; XPS

Indexed keywords

ABSORPTION SPECTROSCOPY; ELECTROCHEMISTRY; MOLECULAR DYNAMICS; POLYCRYSTALLINE MATERIALS; SURFACE TREATMENT; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTROCHEMICAL POLARIZATION CURVES; PM-IRRAS; SULFUR-CONTAINING ALKYLPHOSPHONIC ACIDS;

SULFUR COMPOUNDS;

EID: 40749099018     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2762     Document Type: Article

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