SCOPUS 정보 검색 플랫폼

Volumn 33, Issue 8, 2002, Pages 697-703

Imaging XPS investigation of the lateral distribution of copper inclusions at the abraded surface of 2024T3 aluminium alloy and adsorption of decyl phosphonic acid

(5) Roberts, Adam a Engelberg, Dirk a Liu, Yanwen a Thompson, George E a Alexander, Morgan R a,b

a Kratos Analytical Ltd (United Kingdom)

b UNIVERSITY OF MANCHESTER (United Kingdom)

Author keywords

Adsorption; Aluminium alloy; Decyl phosphonic acid; Imaging XPS; XPS

Indexed keywords

ADSORPTION; ALUMINUM ALLOYS; CHEMICAL MECHANICAL POLISHING; ETCHING; INCLUSIONS; MONOLAYERS; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

ANODIC FILMS;

COPPER;

EID: 0036687554 PISSN: 01422421 EISSN: None Source Type: Journal
DOI: 10.1002/sia.1441 Document Type: Article

Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.