Characterization and sensor properties of sol-gel SiO2:TiO2 film/ion-exchange glass optical waveguides

Optics Communications

Volumn 281, Issue 9, 2008, Pages 2472-2480

  Karasiński, Paweł ^a   Rogoziński, Roman ^a  

^a SILESIAN UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPOSITE MATERIALS; FILM THICKNESS; GLASS; ION EXCHANGE; OPTICAL WAVEGUIDES; SENSITIVITY ANALYSIS;

SENSOR PROPERTIES; WAVEGUIDE FILMS;

SILICA;

EID: 40649120093     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optcom.2007.12.068     Document Type: Article

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