Characterization of an optical waveguide with a composite structure

Journal of Lightwave Technology

Volumn 20, Issue 8, 2002, Pages 1598-1603

  Qi, Zhi Mei ^a,b   Matsuda, Naoki ^a   Itoh, Kiminori ^c   Qing, De Kui ^d  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b INSTITUTE OF ELECTRONICS   (China)

^c YOKOHAMA NATIONAL UNIVERSITY   (Japan)

^d MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Composite structure; Evanescent field enhancement; Polarimetric interference; Potassium ion exchanged (PIE) waveguide; Surface scattering loss; Tapered SiO2 film; Uniform TiO2 film

Indexed keywords

COMPOSITE STRUCTURES; INTERFEROMETERS; LIGHT POLARIZATION; OPTICAL DESIGN; POLARIMETERS; SEMICONDUCTOR DEVICE MANUFACTURE; SILICA; TITANIUM DIOXIDE;

EVANESCENT FIELD ENHANCEMENT; OPTICAL DIRECTIONAL COUPLERS; SINGLE MODE POTASSIUM ION EXCHANGED;

OPTICAL WAVEGUIDES;

EID: 0036705332     PISSN: 07338724     EISSN: None     Source Type: Journal    
DOI: 10.1109/JLT.2002.800269     Document Type: Article

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