Contact-free photovoltage measurements of photoabsorbers using a Kelvin probe

Journal of Applied Physics

Volumn 96, Issue 3, 2004, Pages 1556-1562

  Rühle, Sven ^a   Cahen, David ^a  

^a WEIZMANN INSTITUTE OF SCIENCE   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CAPACITANCE; CAPACITORS; ELECTRIC CONTACTS; ELECTRON ENERGY LEVELS; HETEROJUNCTIONS; HOLE MOBILITY; INTERFACIAL ENERGY; MESOPOROUS MATERIALS; PHOTOVOLTAIC CELLS; SUBSTRATES; TITANIUM DIOXIDE;

BUFFER LAYERS; CONTACT POTENTIAL DIFFERENCE (CPD); KELVIN PROBE (KP); VALENCE BAND;

PHOTOVOLTAIC EFFECTS;

EID: 4043159998     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1767977     Document Type: Article

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