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Volumn 42, Issue 3, 1997, Pages 431-437

Hole diffusion length and temperature dependence of photovoltages for n-Si electrodes modified with LB layers of ultrafine platinum particles

Author keywords

Energy conversion; Minority carrier; Photoelectrochemistry; Semiconductor electrode; Solar cell

Indexed keywords

CHARGE CARRIERS; CURRENT DENSITY; DIFFUSION IN SOLIDS; ELECTRIC CONTACTS; ENERGY CONVERSION; HEAT TREATMENT; LANGMUIR BLODGETT FILMS; PHOTOELECTROCHEMICAL CELLS; PLATINUM; SEMICONDUCTING SILICON; SOLAR CELLS; THERMAL EFFECTS;

EID: 0030837249     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0013-4686(96)00238-1     Document Type: Article
Times cited : (29)

References (21)
  • 1
    • 0003412688 scopus 로고
    • American Solar Energy Soc., Inc. and Plenum Press, New York
    • K. W. Böer (Ed.), Advances in Solar Energy Vol. 6. American Solar Energy Soc., Inc. and Plenum Press, New York (1990).
    • (1990) Advances in Solar Energy , vol.6
    • Böer, K.W.1
  • 2
    • 0042572067 scopus 로고
    • (Photoelectrochemical and Photovoltaics of Layered Semiconductors). Kluwer Academic Publishers, Netherlands
    • A. Aruchamy (Ed.), Phys. Chem. Mater. Low-Dimens. Struct. Vol. 14 (Photoelectrochemical and Photovoltaics of Layered Semiconductors). Kluwer Academic Publishers, Netherlands (1992).
    • (1992) Phys. Chem. Mater. Low-Dimens. Struct. , vol.14
    • Aruchamy, A.1
  • 8
    • 0042572063 scopus 로고
    • Edited by R. Noufi (Photovoltaic Advanced Research & Development Project, Denver, CO), American Institute of Physics, New York
    • J. D. Levine in AIP Conf. (Edited by R. Noufi), Vol. 268 (Photovoltaic Advanced Research & Development Project, Denver, CO), American Institute of Physics, New York, p. 47. (1992).
    • (1992) AIP Conf. , vol.268 , pp. 47
    • Levine, J.D.1
  • 20
    • 0004254886 scopus 로고
    • Properties of silicon
    • INSPEC, The Institution of Electrical Engineers, London and New York
    • Properties of Silicon, EMIS Datareviews Series No. 4, INSPEC, The Institution of Electrical Engineers, London and New York (1987).
    • (1987) EMIS Datareviews Series , vol.4
  • 21
    • 0004184936 scopus 로고
    • New Series III-17a, Section 1.2. Springer Berlin
    • O. Madelung (Ed.) Landolt-Börnstein, New Series III-17a, Section 1.2. Springer Berlin (1982).
    • (1982) Landolt-Börnstein
    • Madelung, O.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.