Critical comparison of dislocation boundary alignment studied by TEM and EBSD: Technical issues and theoretical consequences

Acta Materialia

Volumn 52, Issue 15, 2004, Pages 4437-4446

  Winther, G ^a   Huang, X ^a   Godfrey, A ^b   Hansen, N ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

^b TSINGHUA UNIVERSITY   (China)

Author keywords

Dislocation boundaries; Electron backscattering diffraction; Grain orientation dependence; Transmission electron microscopy

Indexed keywords

BACKSCATTERING; CRYSTALLOGRAPHY; DATA REDUCTION; MATHEMATICAL MODELS; PLASTICITY; POLYCRYSTALS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

BOUNDARY PLANES; DISLOCATION BOUNDARIES; ELECTRON BACKSCATTERING DIFFRACTION; GRAIN ORIENTATION DEPENDENCE;

GRAIN BOUNDARIES;

EID: 4043155873     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2004.05.050     Document Type: Article

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