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Volumn 103, Issue 4, 2008, Pages

Influence of 100 MeV oxygen ion irradiation on Nin-Si (100) Schottky barrier characteristics

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ION BOMBARDMENT; LEAKAGE CURRENTS; PARAMETER ESTIMATION; SCHOTTKY BARRIER DIODES; SILICON;

SCHOTTKY BARRIERS;

OXYGEN;

EID: 40149102368 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2885061 Document Type: Article

Times cited : (16)

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