Defect band structure investigation of postbreakdown SiO2

Applied Physics Letters

Volumn 92, Issue 8, 2008, Pages

  Xu, Mingzhen ^a   Tan, Changhua ^a  

^a PEKING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

BAND STRUCTURE; DEFECTS; ELECTRODES; ONE DIMENSIONAL; WEIBULL DISTRIBUTION;

CRITICAL VALUE; DEFECT RADIUS; WEIBULL SLOPE;

SILICA;

EID: 40049086674     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2888768     Document Type: Article

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