Fast estimation of timing yield bounds for process variations

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Volumn 16, Issue 3, 2008, Pages 241-248

  Chen, Ruiming ^b   Zhou, Hai ^a,b  

^a IEEE

^b Northwestern University   (United States)

Author keywords

Process variations; Statistical static timing analysis (SSTA); Statistical timing

Indexed keywords

DIGITAL CIRCUITS; PATTERN MATCHING; SCALING LAWS; STATISTICAL METHODS;

PROCESS VARIATIONS; STATISTICAL STATIC TIMING ANALYSIS (SSTA); STATISTICAL TIMING;

FEATURE EXTRACTION;

EID: 39749170321     PISSN: 10638210     EISSN: None     Source Type: Journal    
DOI: 10.1109/TVLSI.2007.915398     Document Type: Article

References (12)

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