Development of an Interface C framework for semiconductor e-Diagnostics systems

Robotics and Computer-Integrated Manufacturing

Volumn 24, Issue 3, 2008, Pages 370-383

  Hung, Min Hsiung ^a   Wang, Tsung Li ^b   Hsu, Feng Yi ^a   Cheng, Fan Tien ^b  

^a NATIONAL DEFENSE UNIVERSITY   (Taiwan)

^b NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

Author keywords

Clustering technology; Data isolation; e Diagnostics; Interface C framework; Security measures; Web services

Indexed keywords

INTEROPERABILITY; SECURITY OF DATA; SEMICONDUCTOR MATERIALS; WEB SERVICES; XML;

DATA ISOLATION; SEMICONDUCTOR INDUSTRY;

COMPUTER INTEGRATED MANUFACTURING;

EID: 39749169157     PISSN: 07365845     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.rcim.2007.02.020     Document Type: Article

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