Remote instrument diagnosis on the internet

IEEE Intelligent Systems and Their Applications

Volumn 13, Issue 3, 1998, Pages 70-76

  Caldwell, Nicholas H M ^a,b   Breton, Bernard C ^a,b   Holburn, David M ^a,b,c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b Engineering Department ^*  (United Kingdom)

^c GONVILLE AND CAIUS COLLEGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; COMPUTER AIDED ANALYSIS; DATA ACQUISITION; INSTRUMENT TESTING; ONLINE SYSTEMS; SCANNING ELECTRON MICROSCOPY; WIDE AREA NETWORKS;

REMOTE INSTRUMENT DIAGNOSIS;

EXPERT SYSTEMS;

EID: 0032071691     PISSN: 10947167     EISSN: None     Source Type: Journal    
DOI: 10.1109/5254.683212     Document Type: Article

References (4)

1. H. Eriksson, "Expert Systems as Knowledge Servers," IEEE Expert, Vol. 14, No. 3, May/ June 1996, pp. 14-19.
2. N.H.M. Caldwell, B.C. Breton, and D.M. Holburn, "An Expert System for Fault Diagnosis in the Scanning Electron Microscope," Applications and Innovations In Expert Systems IV, SGES Publications, Cambridge, UK, 1996, pp. 177-188.
3. G. Chand et al., "World Wide Web Controlled SEM," Scanning: The J. Scanning Microscopies, Vol. 19, No. 4, June 1997, pp. 292-296.
4. P. Wayner, "New Videophones Starved for Bandwidth," Byte, Vol. 21, No. 5, May 1996, pp. 125-128.