Accurate and fast estimation of junction band-to-band leakage in nanometer-scale MOSFET

IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

Volumn , Issue , 2006, Pages 956-959

  Luo, Hong ^a   Yang, Huazhong ^a   Luo, Rong ^a  

^a TSINGHUA UNIVERSITY   (China)

Author keywords

Band to band tunneling (BTBT); Doping profile; Estimation; Halo doping; Leakage

Indexed keywords

ESTIMATION; LEAKAGE CURRENTS; MODAL ANALYSIS; NETWORKS (CIRCUITS);

ACCURATE ESTIMATION; AND GATES; ASIA-PACIFIC; BAND-TO-BAND TUNNELING (BTBT); CURRENT LEAKAGES; DEVICE MODELLING; DOPING PROFILE; EMPIRICAL MODELING; ESTIMATION AND OPTIMIZATION; FAST ESTIMATION; HALO DOPING; JUNCTION LEAKAGES; LARGE-SCALE CIRCUITS; LEAKAGE; LEAKAGE ANALYSIS; LEAKAGE POWER; NANO-METER SCALE; PROCESS VARIATIONS; SIMULATION RESULTS; SUB THRESHOLDS;

CIRCUIT SIMULATION;

EID: 39749087603     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/APCCAS.2006.342220     Document Type: Conference Paper

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