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Volumn 112, Issue 2, 2008, Pages 796-807

Minimizing life cycle cost by managing product reliability via validation plan and warranty return cost

Author keywords

Automotive; Life cycle cost; Reliability; Validation; Warranty

Indexed keywords

COMPUTER PROGRAMMING; OPTIMIZATION; PRODUCT DEVELOPMENT; QUALITY OF SERVICE;

EID: 39649110848     PISSN: 09255273     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijpe.2007.07.001     Document Type: Article
Times cited : (82)

References (20)
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    • Kleyner, A.1    Sandborn, P.2
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    • Kleyner, A., Sandborn, P., Boyle, J., 2004. Minimization of life cycle costs through optimization of the validation program-A test sample size and warranty cost approach. In: Proceedings of Annual Reliability and Maintainability Symposium, Los Angeles, CA, pp. 553-557.
    • Kleyner, A., Sandborn, P., Boyle, J., 2004. Minimization of life cycle costs through optimization of the validation program-A test sample size and warranty cost approach. In: Proceedings of Annual Reliability and Maintainability Symposium, Los Angeles, CA, pp. 553-557.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.