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Volumn 81, Issue 1, 2003, Pages 71-77

A mixture model for automobile warranty data

Author keywords

Automobile warranty data; Field failure data; Maximum likelihood estimation; Mixture distributions

Indexed keywords

AUTOMOBILES; DEFECTS; ESTIMATION; MANUFACTURING DATA PROCESSING; QUALITY CONTROL; REPAIR;

EID: 0037843731     PISSN: 09518320     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0951-8320(03)00073-5     Document Type: Article
Times cited : (69)

References (18)
  • 1
    • 0031164692 scopus 로고    scopus 로고
    • Evaluating product and process design changes with warranty data
    • Majeske K.D., Lynch-Caris T., Herrin G.D. Evaluating product and process design changes with warranty data. Int J Prod Economics. 50:1997;79-89.
    • (1997) Int J Prod Economics , vol.50 , pp. 79-89
    • Majeske, K.D.1    Lynch-Caris, T.2    Herrin, G.D.3
  • 3
    • 0026745340 scopus 로고
    • An application of dynamic linear models for predicting warranty claims
    • Wasserman G.S. An application of dynamic linear models for predicting warranty claims. Comput Indus Engng. 22:(1):1992;37-47.
    • (1992) Comput Indus Engng , vol.22 , Issue.1 , pp. 37-47
    • Wasserman, G.S.1
  • 5
    • 0027553181 scopus 로고
    • The warranty problem: Its statistical and game theoretic aspects
    • Singpurwalla N.D., Wilson S. The warranty problem: its statistical and game theoretic aspects. SIAM Rev. 35:1993;17-42.
    • (1993) SIAM Rev , vol.35 , pp. 17-42
    • Singpurwalla, N.D.1    Wilson, S.2
  • 6
    • 0000507373 scopus 로고
    • Methods for the analysis and prediction of warranty claims
    • Kalbfleisch J.D., Lawless J.F., Robinson J.A. Methods for the analysis and prediction of warranty claims. Technometrics. 33:1991;273-285.
    • (1991) Technometrics , vol.33 , pp. 273-285
    • Kalbfleisch, J.D.1    Lawless, J.F.2    Robinson, J.A.3
  • 7
    • 0028408565 scopus 로고
    • A poisson regression model for two-attribute warranty policies
    • Moskowitz H., Chun Y.H. A poisson regression model for two-attribute warranty policies. Naval Res Logistics. 41:1994;355-376.
    • (1994) Naval Res Logistics , vol.41 , pp. 355-376
    • Moskowitz, H.1    Chun, Y.H.2
  • 8
    • 0000819935 scopus 로고    scopus 로고
    • Estimations of rate and mean functions from truncated recurrent event data
    • Hu X.J., Lawless J.F. Estimations of rate and mean functions from truncated recurrent event data. J Am Stat Assoc. 91:(433):1996;300-310.
    • (1996) J Am Stat Assoc , vol.91 , Issue.433 , pp. 300-310
    • Hu, X.J.1    Lawless, J.F.2
  • 9
    • 0035313133 scopus 로고    scopus 로고
    • Field data analysis with additional after-warranty failure data
    • Oh Y.S., Bai D.S. Field data analysis with additional after-warranty failure data. Reliab Engng Syst Safety. 72:(1):2001;1-8.
    • (2001) Reliab Engng Syst Safety , vol.72 , Issue.1 , pp. 1-8
    • Oh, Y.S.1    Bai, D.S.2
  • 12
    • 0022672025 scopus 로고
    • The use of a mixed Weibull Model in occupational injury analysis
    • Chung M.K., Wu S.H., Herrin G.D. The use of a mixed Weibull Model in occupational injury analysis. J Occupational Accidents. 7:1986;239-250.
    • (1986) J Occupational Accidents , vol.7 , pp. 239-250
    • Chung, M.K.1    Wu, S.H.2    Herrin, G.D.3
  • 13
    • 0023288393 scopus 로고
    • Limited failure population life tests: Application to integrated circuit reliability
    • Meeker W.Q. Limited failure population life tests: application to integrated circuit reliability. Technometrics. 29:(1):1987;51-65.
    • (1987) Technometrics , vol.29 , Issue.1 , pp. 51-65
    • Meeker, W.Q.1
  • 14
    • 0026105473 scopus 로고
    • Polyoxide thinning limitation and superior ONO interpoly dielectric of nonvolatile memory device
    • Mori S., Arai N., Kaneko Y., Yoshikawa K. Polyoxide thinning limitation and superior ONO interpoly dielectric of nonvolatile memory device. IEEE Trans Electron Dev. 38:1991;270-276.
    • (1991) IEEE Trans Electron Dev , vol.38 , pp. 270-276
    • Mori, S.1    Arai, N.2    Kaneko, Y.3    Yoshikawa, K.4
  • 15
    • 0031191106 scopus 로고    scopus 로고
    • Study of unipolar pulsed ramp and combined ramped/constant voltage stress on Mos Gate oxides
    • Martin A., O'Sullivan P., Mathewson A. Study of unipolar pulsed ramp and combined ramped/constant voltage stress on Mos Gate oxides. Microelectron Reliab. 37:1997;1045-1051.
    • (1997) Microelectron Reliab , vol.37 , pp. 1045-1051
    • Martin, A.1    O'Sullivan, P.2    Mathewson, A.3
  • 16
    • 0026881075 scopus 로고
    • Maximum likelihood estimates, from censored data, for mixed-Weibull distributions
    • Jiang S., Kececioglu D. Maximum likelihood estimates, from censored data, for mixed-Weibull distributions. IEEE Trans Reliab. 41:(2):1992;248-255.
    • (1992) IEEE Trans Reliab , vol.41 , Issue.2 , pp. 248-255
    • Jiang, S.1    Kececioglu, D.2
  • 18
    • 0001438534 scopus 로고
    • Simulated annealing for constrained global optimization
    • Romeijn H.E., Smith R.L. Simulated annealing for constrained global optimization. J Global Optimization. 5:1994;101-126.
    • (1994) J Global Optimization , vol.5 , pp. 101-126
    • Romeijn, H.E.1    Smith, R.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.