Minimization of life cycle costs through optimization of the validation program - A test sample size and warranty cost approach

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2004, Pages 553-558

  Kleyner, Andre ^a   Sandborn, Peter ^b   Boyle, Joseph ^a  

^a DELPHI CORPORATION   (United States)

^b UNIVERSITY OF MARYLAND   (United States)

Author keywords

Automotive; Cost optimization; Life cycle cost; Reliability cost curve; Sample size; Validation program; Warranty

Indexed keywords

AUTOMOTIVE; COST OPTIMIZATION; LIFE CYCLE COST; RELIABILITY COST CURVE; SAMPLE SIZE; VALIDATION PROGRAM; WARRANTY; LIFECYCLE COSTS; RELIABILITY COSTS; SAMPLE SIZES;

COSTS; OPTIMIZATION; PARAMETER ESTIMATION; PRODUCT DESIGN; PRODUCT DEVELOPMENT; SAMPLING; VECTORS; COST BENEFIT ANALYSIS; CURVE FITTING; DEMONSTRATIONS; DIGITAL STORAGE; DURABILITY; ELECTRONICS INDUSTRY; ENVIRONMENTAL TESTING; MAINTAINABILITY; QUALITY CONTROL; RELIABILITY; SOFTWARE TESTING;

RELIABILITY THEORY; LIFE CYCLE;

EID: 2342537715     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (9)

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