The structure and composition of oxidized and reduced tungsten oxide thin films

Thin Solid Films

Volumn 516, Issue 10, 2008, Pages 2829-2836

  Penner, Simon ^a   Liu, Xianjie ^a   Klötzer, Bernhard ^a   Klauser, Frederik ^a   Jenewein, Bernd ^a   Bertel, Erminald ^a  

^a UNIVERSITY OF INNSBRUCK   (Austria)

Author keywords

W; Electron microscopy; Oxidation; Reduction; Selected area electron diffraction; Tungsten oxide; X ray photoelectron spectroscopy

Indexed keywords

ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; OXIDATION; REDUCTION; X RAY PHOTOELECTRON SPECTROSCOPY;

SELECTED AREA ELECTRON DIFFRACTION; TUNGSTEN OXIDES;

TUNGSTEN COMPOUNDS;

EID: 39649107166     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.05.041     Document Type: Article

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