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Volumn 324, Issue 1-2, 1998, Pages 44-51

Physical and structural characterization of tungsten oxide thin films for NO gas detection

Author keywords

Diffraction; Electron microscopy; Sputtering

Indexed keywords

ELECTRIC PROPERTIES; ELECTRON MICROSCOPY; GAS DETECTORS; MORPHOLOGY; NITROGEN OXIDES; OPTICAL PROPERTIES; SPUTTERING; THIN FILMS; TUNGSTEN COMPOUNDS;

EID: 0032122155     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(97)01205-4     Document Type: Article
Times cited : (98)

References (25)
  • 18
    • 0000055313 scopus 로고
    • G. Mass, R.E. Thun (Eds.), Academic Press, New York
    • O.S. Heavens, in: G. Mass, R.E. Thun (Eds.), Physics of Thin Films, Academic Press, New York, 1964, p. 193.
    • (1964) Physics of Thin Films , pp. 193
    • Heavens, O.S.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.