The effects of drain-bias on the threshold voltage instability in organic TFTs

IEEE Electron Device Letters

Volumn 29, Issue 2, 2008, Pages 155-157

  Zan, Hsiao Wen ^a   Kao, Shin Chin ^a  

^a NATIONAL CHIAO TUNG UNIVERSITY   (Taiwan)

Author keywords

Bias stress effect; Organic thin film transistor (OTFT); Pentacene; Reliability

Indexed keywords

RELIABILITY; SEMICONDUCTING ORGANIC COMPOUNDS; STRESSES; THRESHOLD VOLTAGE;

BIAS-STRESS EFFECT; ORGANIC THIN-FILM TRANSISTOR; PENTACENE;

THIN FILM TRANSISTORS;

EID: 39549117148     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2007.914081     Document Type: Article

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