메뉴 건너뛰기




Volumn 29, Issue 2, 2008, Pages 155-157

The effects of drain-bias on the threshold voltage instability in organic TFTs

Author keywords

Bias stress effect; Organic thin film transistor (OTFT); Pentacene; Reliability

Indexed keywords

RELIABILITY; SEMICONDUCTING ORGANIC COMPOUNDS; STRESSES; THRESHOLD VOLTAGE;

EID: 39549117148     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2007.914081     Document Type: Article
Times cited : (32)

References (9)
  • 1
    • 18744383136 scopus 로고    scopus 로고
    • High-mobility polymer gate dielectric pentacene think film transistors
    • Nov
    • H. Klauk, M. Halik, U. Zschieschang, G. Schmid, and W. Radlik, " High-mobility polymer gate dielectric pentacene think film transistors," J. Appl. Phys, vol. 92, no. 9, pp. 5259-5263, Nov. 2002.
    • (2002) J. Appl. Phys , vol.92 , Issue.9 , pp. 5259-5263
    • Klauk, H.1    Halik, M.2    Zschieschang, U.3    Schmid, G.4    Radlik, W.5
  • 2
    • 34248551507 scopus 로고    scopus 로고
    • Low-voltage organic thin film transistors with hydrophobic aluminum nitride film as gate insulator
    • H.-W. Zan, K.-H. Yen, P.-K. Liu, K.-H. Ku, C.-H. Chen, and J. Hwang, "Low-voltage organic thin film transistors with hydrophobic aluminum nitride film as gate insulator," Org. Electron., vol. 8, pp. 450-454, 2007.
    • (2007) Org. Electron , vol.8 , pp. 450-454
    • Zan, H.-W.1    Yen, K.-H.2    Liu, P.-K.3    Ku, K.-H.4    Chen, C.-H.5    Hwang, J.6
  • 3
    • 0041339891 scopus 로고    scopus 로고
    • Light-induced bias stress reversal in polyfluorene thin-film transistors
    • Jul
    • A. Salleo and R. A. Street, "Light-induced bias stress reversal in polyfluorene thin-film transistors," J. Appl. Phys., vol. 94, no. 1, pp. 471-479, Jul. 2003.
    • (2003) J. Appl. Phys , vol.94 , Issue.1 , pp. 471-479
    • Salleo, A.1    Street, R.A.2
  • 4
    • 0141676353 scopus 로고    scopus 로고
    • Bipolaron mechanism for bias-stress effects in polymer transistors
    • R. A. Street, A. Salleo, and M. L. Chabinyc, "Bipolaron mechanism for bias-stress effects in polymer transistors," Phys. Rev. B, vol. 68, pp. 085316-1-085316-7, 2003.
    • (2003) Phys. Rev. B , vol.68
    • Street, R.A.1    Salleo, A.2    Chabinyc, M.L.3
  • 6
    • 0042338736 scopus 로고    scopus 로고
    • Gap states in organic semiconductors: Hydrogen- and oxygen-induced states in pentacene
    • J. E. Northrup and M. L. Chabinyc, "Gap states in organic semiconductors: Hydrogen- and oxygen-induced states in pentacene," Phys. Rev. B, vol. 68, pp. 041202-1-041202-4, 2003.
    • (2003) Phys. Rev. B , vol.68
    • Northrup, J.E.1    Chabinyc, M.L.2
  • 7
    • 33745024947 scopus 로고    scopus 로고
    • Effect of active layerthickness on bias stress effect in pentacene thin-film transistors
    • J. B. Changa and V. Subramanian, "Effect of active layerthickness on bias stress effect in pentacene thin-film transistors," Appl. Phys. Lett., vol. 88, pp. 233513-1-233513-3, 2006.
    • (2006) Appl. Phys. Lett , vol.88
    • Changa, J.B.1    Subramanian, V.2
  • 8
    • 33846291846 scopus 로고    scopus 로고
    • Reversible memory effects and acceptor states in pentacene-based organic thin-film transistors
    • G. Gu, M. G. Kane, and S.-C. Mau, "Reversible memory effects and acceptor states in pentacene-based organic thin-film transistors," J. Appl. Phys., vol. 101, no. 1, pp. 014504-1-014504-9, 2007.
    • (2007) J. Appl. Phys , vol.101 , Issue.1
    • Gu, G.1    Kane, M.G.2    Mau, S.-C.3
  • 9
    • 1942488244 scopus 로고    scopus 로고
    • Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs
    • Apr
    • K. S. Karim, A. Nathan, M. Hack, and W. I. Milne, "Drain-bias dependence of threshold voltage stability of amorphous silicon TFTs," IEEE Electron Device Lett, vol. 25, no. 4, pp. 188-190, Apr. 2004.
    • (2004) IEEE Electron Device Lett , vol.25 , Issue.4 , pp. 188-190
    • Karim, K.S.1    Nathan, A.2    Hack, M.3    Milne, W.I.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.