Negative bias temperature instability: Recoverable versus permanent degradation

ESSDERC 2007 - Proceedings of the 37th European Solid-State Device Research Conference

Volumn 2007, Issue , 2007, Pages 127-130

  Grasser, Tibor ^a   Kaczer, Ben ^b  

^a ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^b IMEC   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POWER SYSTEMS; STRESS RELAXATION; THERMODYNAMIC STABILITY; THRESHOLD VOLTAGE;

NBTI; POWER-LAW EXPONENTS; STRESSING VOLTAGES; VOLTAGE SHIFT;

SOLID STATE DEVICES;

EID: 39549099287     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ESSDERC.2007.4430895     Document Type: Conference Paper

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