Field induced electro-optical characterization in poly-3-hexylthiophene MIS capacitor

Thin Solid Films

Volumn 516, Issue 9, 2008, Pages 2568-2572

  Itoh, Eiji ^a   Nagai, Hiroshi ^a   Miyairi, Keiichi ^a  

^a SHINSHU UNIVERSITY   (Japan)

Author keywords

Charge modulation spectroscopy; MIS capacitor; Polyimide; Polythiophene

Indexed keywords

CAPACITORS; ELECTROOPTICAL EFFECTS; INTERFACES (MATERIALS); POLYIMIDES; SPECTROSCOPIC ANALYSIS;

CHARGE MODULATION SPECTROSCOPY; ELECTRO-ABSORPTION; GATE BIAS; POLYTHIOPHENE; SUBGAP TRANSITION;

MIS DEVICES;

EID: 39449083227     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.04.102     Document Type: Article

References (15)

1. Ebisawa E., Kurosawa T., and Nara S. J. Appl. Phys. 54 (1983) 3255
2. Burroughes J.H., Jones C.A., and Friend R.H. Nature 335 (1988) 137
3. Bao Z., Dodabalapur A., and Lovinger A.J. Appl. Phys. Lett. 69 (1996) 4108
4. Sirringhaus H., Tessler N., and Friend R.H. Science 280 (1998) 1741
5. Wang G., Swensen J., Moses D., and Heeger A.J. J. Appl. Phys. 93 (2003) 6137
6. Forrest S.R. Nature 428 (2004) 911
7. Sirringhaus H., Buergi L., Kawase T., and Friend R.H. In: Kagan C.R., and Andry P. (Eds). Thin Film Transistors (2003), Marcel Dekker, New York 427
8. Sirringhaus H. Adv. Mater. 17 (2005) 2411
9. Sirringhaus H., Brown P.J., Friend R.H., Nielsen M.M., Bechgaard K., Langeveld-Voss B.M.W., Spiering A.J.H., Janssen R.A.J., Meijer E.W., Herwigs P., and de Leeuws D.M. Nature 401 (1999) 685
10. Brown B.J., Sirringhaus H., and Friend R.H. Synthetic Metals 101 (1999) 557
11. Beljonne D., Cornil J., Sirringhaus H., Brown P.J., Shkunov M., Friend R.H., and Bredas J.L. Adv. Func. Mater. 11 (2001) 229
12. Torres I., Taylor D.M., and Itoh E. Appl. Phys. Lett. 85 (2004) 314
13. Itoh E., Torres I., and Taylor D.M. Jpn. J. Appl. Phys. 44 (2005)
14. Abdou M.S.A., Orfino F.P., Son Y., and Holdcroft S. J. Am. Chem. Soc. 119 (1997) 4518
15. Meijer E.J., Deteheverry C., Baesjou P.J., van Veenendaal E., de Leeuw D.M., and Klapwijk T.M. J. Appl. Phys. 93 (2003) 4831