Analysis of local composition gradients in the hard-phase grains of cermets using a combination of X-ray diffraction and electron microscopy

International Journal of Refractory Metals and Hard Materials

Volumn 26, Issue 3, 2008, Pages 263-275

  Rafaja, David ^a   Dopita, Milan ^a,b   Masimov, Magsud ^a   Klemm, Volker ^a   Wendt, Nina ^c   Lengauer, Walter ^c  

^a TU BERGAKADEMIE FREIBERG   (Germany)

^b CHARLES UNIVERSITY   (Czech Republic)

^c VIENNA UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

Cermets; EBSD; EDX; SEM; XRD

Indexed keywords

BACKSCATTERING; ELECTRON DIFFRACTION; ENERGY DISPERSIVE SPECTROSCOPY; GRAIN SIZE AND SHAPE; MICROSTRUCTURAL EVOLUTION; SCANNING ELECTRON MICROSCOPY; X RAY DIFFRACTION;

ELECTRON BACKSCATTER DIFFRACTION (EBSD); HARD PHASE GRAINS; MICROSTRUCTURE MODELS;

CERMETS;

EID: 38949216344     PISSN: 02634368     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ijrmhm.2007.03.004     Document Type: Article

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