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Volumn 40, Issue 1, 2007, Pages 49-54
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Preparation and characterization of obliquely deposited copper oxide thin films
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
COPPER OXIDES;
DEPOSITION;
ELECTRIC CONDUCTIVITY;
MICROSTRUCTURE;
SCANNING ELECTRON MICROSCOPY;
SYNTHESIS (CHEMICAL);
THIN FILMS;
X RAY DIFFRACTION;
COPPER OXIDE THIN FILMS;
OBLIQUELY ANGLE DEPOSITION;
VAPOR FLUX;
OXIDE FILMS;
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EID: 38949184864
PISSN: 12860042
EISSN: 12860050
Source Type: Journal
DOI: 10.1051/epjap:2007128 Document Type: Article |
Times cited : (31)
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References (24)
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