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Volumn 40, Issue 1, 2007, Pages 49-54

Preparation and characterization of obliquely deposited copper oxide thin films

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COPPER OXIDES; DEPOSITION; ELECTRIC CONDUCTIVITY; MICROSTRUCTURE; SCANNING ELECTRON MICROSCOPY; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION;

EID: 38949184864     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap:2007128     Document Type: Article
Times cited : (31)

References (24)
  • 5
    • 33748866090 scopus 로고    scopus 로고
    • Y. bar-Yam, Phys. Rev. B 43, 2601 (1991)
    • Y. bar-Yam, Phys. Rev. B 43, 2601 (1991)
  • 6
    • 0000665960 scopus 로고    scopus 로고
    • J.B. Good enough, J.S. Zhou, J. Chan, Phys. Rev. B 47, 5275 (1993)
    • J.B. Good enough, J.S. Zhou, J. Chan, Phys. Rev. B 47, 5275 (1993)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.