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Volumn 80, Issue 3, 2008, Pages 891-897

Sequential monitoring of film thickness variations with surface plasmon resonance imaging and imaging ellipsometry constructed with a single optical system

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; OPTICAL SYSTEMS; SURFACE PLASMON RESONANCE; ULTRATHIN FILMS;

EID: 38949175788     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac701873v     Document Type: Article
Times cited : (4)

References (41)
  • 3
    • 0025920073 scopus 로고
    • Brown, C. A.; Savary, G. Wear 1991, 141 (2), 211-26.
    • (1991) Wear , vol.141 , Issue.2 , pp. 211-226
    • Brown, C.A.1    Savary, G.2
  • 21
    • 0042725236 scopus 로고    scopus 로고
    • Surface Plasmon Resonance Measurements of Ultrathin Organic Films at Electrode Surfaces
    • Bard, A. J, Rubinstein, I, Eds, Marcel Dekker, Inc, New York
    • Hanken, D. G.; Jordan, C. E.; Frey, B. L.; Corn, R. M. Surface Plasmon Resonance Measurements of Ultrathin Organic Films at Electrode Surfaces. In Electroanalytical Chemistry, Bard, A. J., Rubinstein, I., Eds.; Marcel Dekker, Inc.: New York, 1998; Vol. 20, pp 141-225.
    • (1998) Electroanalytical Chemistry , vol.20 , pp. 141-225
    • Hanken, D.G.1    Jordan, C.E.2    Frey, B.L.3    Corn, R.M.4
  • 26
    • 0000757655 scopus 로고
    • Abeles, F. Surf. Sci. 1976, 56, 237-251.
    • (1976) Surf. Sci , vol.56 , pp. 237-251
    • Abeles, F.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.