SCOPUS 정보 검색 플랫폼

Volumn 26, Issue 1, 2008, Pages 102-105

Surface structure characterization of nanodiamond thin film for electronic field emission applications

Author keywords

[No Author keywords available]

Indexed keywords

COATING TECHNIQUES; NANOSTRUCTURED MATERIALS; NUCLEAR MAGNETIC RESONANCE; SILICON; SINGLE CRYSTALS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANNEALING TEMPERATURE; DIP-COATING TECHNIQUE; ELECTRON FIELD EMISSION; HYBRIDIZED CARBON;

THIN FILMS;

EID: 38849157959 PISSN: 10711023 EISSN: None Source Type: Journal
DOI: 10.1116/1.2825144 Document Type: Article

Times cited : (16)

References (12)

1
- 0034155534
- JVTBD9 1071-1023 10.1116/1.591325.
- N. S. Xu, Jian Chen, Y. T. Feng, and S. Z. Deng, J. Vac. Sci. Technol. B JVTBD9 1071-1023 10.1116/1.591325 18, 1048 (2000).
- (2000) J. Vac. Sci. Technol. B , vol.18 , pp. 1048
- Xu, N.S.¹ Chen, J.² Feng, Y.T.³ Deng, S.Z.⁴

2
- 0242303728
- JAPIAU 0021-8979 10.1063/1.1611281.
- Jian Chen, S. Z. Deng, Jun Chen, J. C. She, and N. S. Xu, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.1611281 94, 5429 (2003).
- (2003) J. Appl. Phys. , vol.94 , pp. 5429
- Chen, J.¹ Deng, S.Z.² Chen, J.³ She, J.C.⁴ Xu, N.S.⁵

3
- 14144249683
- MIGIEA 0927-796X 10.1016/j.mser.2004.12.001.
- N. S. Xu and S. E. Huq, Mater. Sci. Eng., R. MIGIEA 0927-796X 10.1016/j.mser.2004.12.001 48, 47 (2005).
- (2005) Mater. Sci. Eng., R. , vol.48 , pp. 47
- Xu, N.S.¹ Huq, S.E.²

4
- 0037798014
- PRBMDO 0163-1829 10.1103/PhysRevB.54.8064.
- J. Diaz, G. Paolicelli, S. Ferrer, and F. Comin, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.54.8064 54, 8064 (1996).
- (1996) Phys. Rev. B , vol.54 , pp. 8064
- Diaz, J.¹ Paolicelli, G.² Ferrer, S.³ Comin, F.⁴

5
- 0035545914
- JESRAW 0368-2048 10.1016/S0368-2048(01)00334-6.
- I. B. Wilson, J. S. Waltona, and G. Beamson, J. Electron Spectrosc. Relat. Phenom. JESRAW 0368-2048 10.1016/S0368-2048(01)00334-6 121, 183 (2001).
- (2001) J. Electron Spectrosc. Relat. Phenom. , vol.121 , pp. 183
- Wilson, I.B.¹ Waltona, J.S.² Beamson, G.³

6
- 38649109604
- SUSCAS 0039-6028 10.1016/0039-6028(87)90011-2.
- Y. Mizokawa, T. Miyasato, and S. Nakamura, Surf. Sci. SUSCAS 0039-6028 10.1016/0039-6028(87)90011-2 182, 431 (1987).
- (1987) Surf. Sci. , vol.182 , pp. 431
- Mizokawa, Y.¹ Miyasato, T.² Nakamura, S.³

7
- 0001631434
- PRLTAO 0031-9007 10.1103/PhysRevLett.79.2340.
- F. Mauri, B. G. Pfrommer, and S. G. Louie, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.79.2340 79, 2340 (1997).
- (1997) Phys. Rev. Lett. , vol.79 , pp. 2340
- Mauri, F.¹ Pfrommer, B.G.² Louie, S.G.³

8
- 0141864704
- PRBMDO 0163-1829 10.1103/PhysRevB.50.15623.
- K. Lefmann and B. Buras, Phys. Rev. B PRBMDO 0163-1829 10.1103/PhysRevB.50.15623 50, 15623 (1994).
- (1994) Phys. Rev. B , vol.50 , pp. 15623
- Lefmann, K.¹ Buras, B.²

9
- 0036837303
- JPCSAW 0022-3697 10.1016/S0022-3697(02)00185-3.
- A. I. Shames, J. Phys. Chem. Solids JPCSAW 0022-3697 10.1016/S0022- 3697(02)00185-3 63, 1993 (2002).
- (2002) J. Phys. Chem. Solids , vol.63 , pp. 1993
- Shames, A.I.¹

10
- 17744419645
- 0304-3843
- C. J. Hill, J. Wu, and M. J. R. Hoch, Hyperfine Interact. 120-121, 81 (1999). 0304-3843
- (1999) Hyperfine Interact. , vol.120-121 , pp. 81
- Hill, C.J.¹ Wu, J.² Hoch, M.J.R.³

11
- 23544472163
- CHPLBC 0009-2614 10.1016/0009-2614(94)87072-1.
- V. L. Kuznetsov, A. L. Chuvilin, Yu. V. Butenko, I. Yu. Mal'kov, and V. M. Titov, Chem. Phys. Lett. CHPLBC 0009-2614 10.1016/0009-2614(94)87072-1 222, 343 (1994).
- (1994) Chem. Phys. Lett. , vol.222 , pp. 343
- Kuznetsov, V.L.¹ Chuvilin, A.L.² Butenko, Yu.V.³ Mal'Kov, I.Yu.⁴ Titov, V.M.⁵

12
- 36449000201
- JAPIAU 0021-8979 10.1063/1.360066.
- W. Zhu, G. P. Kochanski, S. Jin, and L. Seibles, J. Appl. Phys. JAPIAU 0021-8979 10.1063/1.360066 78, 2707 (1995).
- (1995) J. Appl. Phys. , vol.78 , pp. 2707
- Zhu, W.¹ Kochanski, G.P.² Jin, S.³ Seibles, L.⁴

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