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Volumn 18, Issue 2, 2000, Pages 1048-1050
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Nanostructured diamond film on etched silicon and its field emission behavior
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Author keywords
[No Author keywords available]
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Indexed keywords
BAND STRUCTURE;
CURRENT VOLTAGE CHARACTERISTICS;
DEPOSITION;
DIAMOND FILMS;
ELECTRON EMISSION;
ELECTRON TUNNELING;
NANOSTRUCTURED MATERIALS;
SEMICONDUCTING SILICON;
SURFACE ROUGHNESS;
CONDUCTION BANDS;
ELECTRON AFFINITY;
NANOSTRUCTURED DIAMOND FILMS;
FIELD EMISSION CATHODES;
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EID: 0034155534
PISSN: 10711023
EISSN: None
Source Type: Journal
DOI: 10.1116/1.591325 Document Type: Article |
Times cited : (8)
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References (13)
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