-
1
-
-
0029251968
-
A 3.3 V 32 Mb NAND Flash memory with incremental step pulse programming scheme
-
San Francisco, CA, Feb
-
K. D. Suh, B.-H. Suh, Y.-H. Lim, J.-K. Kim, Y.-J. Choi, Y.-N. Koh, S.-S. Lee, S.-C. Kwon, B.-S. Choi, J.-S. Yum, J.-H. Choi, J.-R. Kim, and H.-K. Lim, "A 3.3 V 32 Mb NAND Flash memory with incremental step pulse programming scheme," in IEEE ISSCC 1995 Dig. Tech. Papers, San Francisco, CA, Feb. 1995, pp. 128-129.
-
(1995)
IEEE ISSCC 1995 Dig. Tech. Papers
, pp. 128-129
-
-
Suh, K.D.1
Suh, B.-H.2
Lim, Y.-H.3
Kim, J.-K.4
Choi, Y.-J.5
Koh, Y.-N.6
Lee, S.-S.7
Kwon, S.-C.8
Choi, B.-S.9
Yum, J.-S.10
Choi, J.-H.11
Kim, J.-R.12
Lim, H.-K.13
-
2
-
-
0030081176
-
A 3.3 V 128 Mb multi-level NAND Flash memory for mass storage applications
-
San Francisco, CA, Feb
-
T.-S. Jung, Y.-J. Choi, K.-D. Suh, B.-H. Suh, J.-K. Kim, Y.-H. Lim, Y.-N. Koh, J.-W. Park, K.-J. Lee, J.-H. Park, K.-T. Park, J.-R. Kim, J.-H. Lee, and H.-K. Lim, "A 3.3 V 128 Mb multi-level NAND Flash memory for mass storage applications," in IEEE ISSCC 1996 Dig. Tech. Papers, San Francisco, CA, Feb. 1996, pp. 32-33.
-
(1996)
IEEE ISSCC 1996 Dig. Tech. Papers
, pp. 32-33
-
-
Jung, T.-S.1
Choi, Y.-J.2
Suh, K.-D.3
Suh, B.-H.4
Kim, J.-K.5
Lim, Y.-H.6
Koh, Y.-N.7
Park, J.-W.8
Lee, K.-J.9
Park, J.-H.10
Park, K.-T.11
Kim, J.-R.12
Lee, J.-H.13
Lim, H.-K.14
-
3
-
-
0035054744
-
A 3.3 V 1 Gb multi-level NAND Flash memory with non-uniform threshold voltage distrution
-
San Francisco, CA, Feb
-
T. Cho, Y.-T. Lee, E. Kim, J. Lee, S. Choi, S. Lee, D.-H. Kim, W.-K. Han, Y.-H. Lim, J.-D. Lee, J.-D. Choi, and K.-D. Suh, "A 3.3 V 1 Gb multi-level NAND Flash memory with non-uniform threshold voltage distrution," in IEEE ISSCC 2001 Dig. Tech. Papers, San Francisco, CA, Feb. 2001, pp. 28-29.
-
(2001)
IEEE ISSCC 2001 Dig. Tech. Papers
, pp. 28-29
-
-
Cho, T.1
Lee, Y.-T.2
Kim, E.3
Lee, J.4
Choi, S.5
Lee, S.6
Kim, D.-H.7
Han, W.-K.8
Lim, Y.-H.9
Lee, J.-D.10
Choi, J.-D.11
Suh, K.-D.12
-
4
-
-
0035051398
-
2 and-type 512 Mb Flash memory with 1.8 V power supply
-
San Francisco, CA, Feb
-
2 and-type 512 Mb Flash memory with 1.8 V power supply," in IEEE ISSCC 2001 Dig. Tech. Papers, San Francisco, CA, Feb. 2001, pp. 30-31.
-
(2001)
IEEE ISSCC 2001 Dig. Tech. Papers
, pp. 30-31
-
-
Ishii, T.1
Oshima, K.2
Sato, H.3
Noda, S.4
Kishimoto, J.5
Kotani, H.6
Nozoe, A.7
Furusawa, K.8
Yoshitake, T.9
Kato, M.10
Takahashi, M.11
Sato, A.12
Kubono, S.13
Manita, K.14
Koda, K.15
Nakayama, T.16
Hosogane, A.17
-
5
-
-
3142773890
-
Introduction to Flash memory
-
Apr
-
R. Bez, E. E. Camerlenghi, A. Modelli, and A. Visconti, "Introduction to Flash memory," Proc. IEEE, vol. 91, no. 4, pp. 489-502, Apr. 2003.
-
(2003)
Proc. IEEE
, vol.91
, Issue.4
, pp. 489-502
-
-
Bez, R.1
Camerlenghi, E.E.2
Modelli, A.3
Visconti, A.4
-
6
-
-
0344981536
-
Cost-efficient memory architecture design of NAND Flash memory embedded systems
-
San Jose, CA, Oct
-
C. Park, J. Seo, D. Seo, S. Kim, and B. Kim, "Cost-efficient memory architecture design of NAND Flash memory embedded systems," in Proc. Int. Conf. Computer Design, San Jose, CA, Oct. 2003, pp. 474-480.
-
(2003)
Proc. Int. Conf. Computer Design
, pp. 474-480
-
-
Park, C.1
Seo, J.2
Seo, D.3
Kim, S.4
Kim, B.5
-
7
-
-
28344453851
-
Challenges in embedded memory design and test
-
Messe Munich, Germany, Mar
-
E. J. Marinissen, B. Prince, D. Keitel-Schulz, and Y. Zorian, "Challenges in embedded memory design and test," in Proc. Design, Automation, and Test in Europe (DATE'05), Messe Munich, Germany, Mar. 2005, pp. 722-727.
-
(2005)
Proc. Design, Automation, and Test in Europe (DATE'05)
, pp. 722-727
-
-
Marinissen, E.J.1
Prince, B.2
Keitel-Schulz, D.3
Zorian, Y.4
-
8
-
-
0037634385
-
Degradation of tunnel oxide by FN current stress and its effects on data retention characteristics of 90-nm NAND Flash memory cells
-
Dallas, TX, Mar
-
J.-D. Lee, J.-H. Choi, D. Park, and K. Kim, "Degradation of tunnel oxide by FN current stress and its effects on data retention characteristics of 90-nm NAND Flash memory cells," in Proc. Int. Reliability Physics Symp., Dallas, TX, Mar. 2003, pp. 497-501.
-
(2003)
Proc. Int. Reliability Physics Symp
, pp. 497-501
-
-
Lee, J.-D.1
Choi, J.-H.2
Park, D.3
Kim, K.4
-
9
-
-
0036858571
-
High-performance 1-Gb NAND Flash memory with 0.12-μm technology
-
Nov
-
J. Lee, H.-S. Im, D.-S. Byeon, K.-H. Lee, D.-H. Chae, K.-H. Lee, S. Hwang, S.-S. Lee, Y.-H. Lim, J.-D. Lee, J.-D. Choi, Y.-I. Seo, J.-S. Lee, and K.-D. Suh, "High-performance 1-Gb NAND Flash memory with 0.12-μm technology," IEEE J. Solid-State Circuits, vol. 37, no. 11, pp. 1502-1509, Nov. 2002.
-
(2002)
IEEE J. Solid-State Circuits
, vol.37
, Issue.11
, pp. 1502-1509
-
-
Lee, J.1
Im, H.-S.2
Byeon, D.-S.3
Lee, K.-H.4
Chae, D.-H.5
Lee, K.-H.6
Hwang, S.7
Lee, S.-S.8
Lim, Y.-H.9
Lee, J.-D.10
Choi, J.-D.11
Seo, Y.-I.12
Lee, J.-S.13
Suh, K.-D.14
-
10
-
-
0031340143
-
Floating-well charge pump circuits for sub-2.0 V single power supply Flash memories
-
Kyoto, Japan, Jun
-
K.-H. Choi, J.-M. Park, J.-K. Kim, T.-S. Jung, and K.-D. Suh, "Floating-well charge pump circuits for sub-2.0 V single power supply Flash memories," in Symp. VLSI Circuits Dig. Tech. Papers, Kyoto, Japan, Jun. 1997, pp. 61-62.
-
(1997)
Symp. VLSI Circuits Dig. Tech. Papers
, pp. 61-62
-
-
Choi, K.-H.1
Park, J.-M.2
Kim, J.-K.3
Jung, T.-S.4
Suh, K.-D.5
-
11
-
-
0016961262
-
On-chip high-voltage generation in MNOS integrated circuits using an improved voltage multiplier technique
-
Jun
-
J. F. Dickson, "On-chip high-voltage generation in MNOS integrated circuits using an improved voltage multiplier technique," IEEE J. Solid-State Circuits, vol. SSC-11, no. 2, pp. 374-378, Jun. 1976.
-
(1976)
IEEE J. Solid-State Circuits
, vol.SSC-11
, Issue.2
, pp. 374-378
-
-
Dickson, J.F.1
-
12
-
-
0031210141
-
A dynamic analysis of the Dickson charge pump circuit
-
Aug
-
T. Tanzawa and T. Tanaka, "A dynamic analysis of the Dickson charge pump circuit," IEEE J. Solid-State Circuits, vol. 32, no. 8, pp. 1231-1240, Aug. 1997.
-
(1997)
IEEE J. Solid-State Circuits
, vol.32
, Issue.8
, pp. 1231-1240
-
-
Tanzawa, T.1
Tanaka, T.2
-
13
-
-
0036859984
-
Charge-pump circuits: Power-consumption, optimization
-
Nov
-
G. Palumbo, D. Pappalardo, and M. Gaibotti, "Charge-pump circuits: power-consumption, optimization," IEEE Trans. Circuits Syst. I, Fundam. Theory Applicat., vol. 49, no. 11, pp. 1535-1542, Nov. 2002.
-
(2002)
IEEE Trans. Circuits Syst. I, Fundam. Theory Applicat
, vol.49
, Issue.11
, pp. 1535-1542
-
-
Palumbo, G.1
Pappalardo, D.2
Gaibotti, M.3
-
14
-
-
67649171947
-
A low ripple fully integrated charge pump regulator
-
Sep
-
J. Soldera, A. V. Boas, and A. Olmos, "A low ripple fully integrated charge pump regulator," in. Proc. 16th Symp. Integrated Circuits and Systems Design, Sep. 2003, pp. 177-180.
-
(2003)
Proc. 16th Symp. Integrated Circuits and Systems Design
, pp. 177-180
-
-
Soldera, J.1
Boas, A.V.2
Olmos, A.3
-
15
-
-
31644450274
-
A regulated charge pump with small ripple voltage and fast start-up
-
Feb
-
J.-Y. Lee, S.-E. Kim, S.-J. Song, J.-K. Kim, S. Kim, and H.-J. Yoo, "A regulated charge pump with small ripple voltage and fast start-up," IEEE J. Solid-State Circuits, vol. 41, no. 2, pp. 425-432, Feb. 2006.
-
(2006)
IEEE J. Solid-State Circuits
, vol.41
, Issue.2
, pp. 425-432
-
-
Lee, J.-Y.1
Kim, S.-E.2
Song, S.-J.3
Kim, J.-K.4
Kim, S.5
Yoo, H.-J.6
-
16
-
-
38849146249
-
A triple polysilicon stacked Flash memory cell with wordline self-boosting programming
-
Dec
-
J. D. Choi, D. G. Lee, D. J. Kim, S. S. Cho, H. S. Kim, C. H. Shin, and S. T. Ahn, "A triple polysilicon stacked Flash memory cell with wordline self-boosting programming," in Int. Electron Devices Meeting (IEDM) Tech. Dig., Dec. 1997, pp. 283-286.
-
(1997)
Int. Electron Devices Meeting (IEDM) Tech. Dig
, pp. 283-286
-
-
Choi, J.D.1
Lee, D.G.2
Kim, D.J.3
Cho, S.S.4
Kim, H.S.5
Shin, C.H.6
Ahn, S.T.7
|