A simple method for producing flattened atomic force microscopy tips

Review of Scientific Instruments

Volumn 79, Issue 1, 2008, Pages

  Biagioni, P ^a,b   Farahani, J N ^a,c   Muhlschlegel P ^a,d   Eisler, H J ^a,e   Pohl, D W ^a   Hecht, B ^a,f  

^a UNIVERSITY OF BASEL   (Switzerland)

^b POLITECNICO DI MILANO   (Italy)

^c SWISS FEDERAL LABORATORIES FOR MATERIALS SCIENCE AND TECHNOLOGY   (Switzerland)

^d CIBA GEIGY LTD   (Switzerland)

^e UNIVERSITY OF KARLSRUHE   (Germany)

^f UNIVERSITY OF WÜRZBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COST EFFECTIVENESS; LASER PULSES; NANOTIPS; SILICON NITRIDE; SUBSTRATES;

FLATTENED TIPS; NUMERICAL APERTURE; PLATEAU TIPS;

ATOMIC FORCE MICROSCOPY;

ARTICLE; ATOMIC FORCE MICROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; TRANSDUCER;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; TRANSDUCERS;

EID: 38849088637     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2834875     Document Type: Article

References (9)

1. F. J. Giessibl, Rev. Mod. Phys. RMPHAT 0034-6861 10.1103/RevModPhys.75. 949 75, 949 (2003).
2. L. Novotny and B. Hecht, Principles of Nano-Optics (Cambridge University Press, Cambridge, 2006).
3. J. N. Farahani, D. W. Pohl, H.-J. Eisler, and B. Hecht, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.95.017402 95, 017402 (2005).
4. S. Kühn, U. Hkanson, L. Rogobete, and V. Sandoghdar, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.97.017402 97, 017402 (2006).
5. M. Danckwerts and L. Novotny, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.98.026104 98, 026104 (2007).
6. Y. Gan, Rev. Sci. Instrum. RSINAK 0034-6748 10.1063/1.2754076 78, 081101 (2007).
7. J. N. Farahani, H.-J. Eisler, D. W. Pohl, M. Pavius, P. Flückiger, P. Gasser, and B. Hecht, Nanotechnology NNOTER 0957-4484 10.1088/0957-4484/18/ 12/125506 18, 125506 (2007).
8. DNP Series Probes, Veeco Instruments (http://veeco.com).
9. B. Hecht, P. Mühlschlegel, J. N. Farahani, H.-J. Eisler, D. W. Pohl, O. J. F. Martin, and P. Biagioni, Chimia CHIMAD 0009-4293 10.2533/chimia.2006. 765 60, 765 (2006).