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Volumn 58, Issue 7, 2008, Pages 549-552

Enhanced dielectric tunability in barium titanate thin films with boron additions

Author keywords

Copper; Dielectrics; Ferroelectricity; Grain growth; Thin films

Indexed keywords

BARIUM TITANATE; COPPER; FERROELECTRICITY; GRAIN GROWTH; MICROSTRUCTURE; OPTIMIZATION; PERMITTIVITY; POLYCRYSTALLINE MATERIALS;

EID: 38749141776     PISSN: 13596462     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.scriptamat.2007.11.008     Document Type: Article
Times cited : (9)

References (24)
  • 17
    • 38749153684 scopus 로고    scopus 로고
    • ASTM E 112-96, Standard Test Methods for Determining Average Grain Size, ASTM International, 2003.
    • ASTM E 112-96, Standard Test Methods for Determining Average Grain Size, ASTM International, 2003.
  • 24
    • 38749108222 scopus 로고    scopus 로고
    • J.F. Ihlefeld, Ph.D. Thesis, North Carolina State University, 2006.
    • J.F. Ihlefeld, Ph.D. Thesis, North Carolina State University, 2006.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.