A methodology for curve-fitting of the XPS Si 2p core level from thin siloxane coatings

Surface and Interface Analysis

Volumn 39, Issue 12-13, 2007, Pages 926-936

  O'Hare, Lesley Ann ^a   Hynes, Alan ^a   Alexander, Morgan R ^b  

^a Dow Corning Plasma Solutions   (Ireland)

^b UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

Plasma; Si 2p; XPS

Indexed keywords

ATMOSPHERIC PRESSURE; BINDING ENERGY; CURVE FITTING; POLYETHYLENE TEREPHTHALATES; SURFACE PROPERTIES;

PLASMA LIQUID DEPOSITION; THIN SILOXANE COATINGS;

COATINGS;

EID: 38749111157     PISSN: 01422421     EISSN: 10969918     Source Type: Journal    
DOI: 10.1002/sia.2634     Document Type: Article

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