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Volumn 69, Issue 2-3, 2008, Pages 501-504

Controlling Ta phase in Ta/TaN bilayer by surface pre-treatment on TaN

Author keywords

A. Electronic materials; A. Semiconductor; A. Thin film; D. Electrical properties

Indexed keywords

ELECTRIC PROPERTIES; SEMICONDUCTOR MATERIALS; SURFACE TREATMENT;

EID: 38749099043     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2007.11.022     Document Type: Article
Times cited : (16)

References (8)
  • 1
    • 38749094553 scopus 로고    scopus 로고
    • D. Edelstein, C. Uzoh, C. Cabral, P. DeHaven, P. Buchwalter, A. Simon, E. Cooney, S. Malhotra, D. Klaus, H. Rathore, B. Agarwala, D. Nguyen, in: Proceedings of the IEEE International Interconnect Technology Conference, 2001, p. 9.
    • D. Edelstein, C. Uzoh, C. Cabral, P. DeHaven, P. Buchwalter, A. Simon, E. Cooney, S. Malhotra, D. Klaus, H. Rathore, B. Agarwala, D. Nguyen, in: Proceedings of the IEEE International Interconnect Technology Conference, 2001, p. 9.
  • 7
    • 38749152549 scopus 로고    scopus 로고
    • J. Chen, S. Parikh, T. Vo, S. Rengarajan, T. Mandewkar, P. Ding, L. Chen, R. Mosely, Interconnect Technology Conference, vol. 3-5, 2002, p. 185.
    • J. Chen, S. Parikh, T. Vo, S. Rengarajan, T. Mandewkar, P. Ding, L. Chen, R. Mosely, Interconnect Technology Conference, vol. 3-5, 2002, p. 185.
  • 8
    • 84944053866 scopus 로고    scopus 로고
    • G.B. Alers, R.T. Rozbicki, G.J. Harm, S.K. Kailasam, G.W. Ray, M. Danek, in: Proceedings of the IEEE 2003 International Technology Conference, 2003, p. 27.
    • G.B. Alers, R.T. Rozbicki, G.J. Harm, S.K. Kailasam, G.W. Ray, M. Danek, in: Proceedings of the IEEE 2003 International Technology Conference, 2003, p. 27.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.