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Volumn 516, Issue 8, 2008, Pages 1941-1951

Nanoindentation stress-strain curves of plasma-enhanced chemical vapor deposited silicon oxide thin films

Author keywords

Nanoindentation; Plasma enhanced chemical vapor deposition; Silicon oxide; Stress strain

Indexed keywords

NANOINDENTATION; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION; THIN FILMS;

EID: 38649133335     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.09.033     Document Type: Article
Times cited : (33)

References (35)
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  • 8
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    • (2004) J. Mater. Res. , vol.19 , pp. 46
    • Schuh, C.A.1    Nieh, T.G.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.