Visual force sensing with flexible nanowire buckling springs

Nanotechnology

Volumn 19, Issue 3, 2008, Pages

  Dobrokhotov, Vladimir V ^a   Yazdanpanah, Mehdi M ^a   Pabba, Santosh ^a   Safir, Abdelilah ^a   Cohn, Robert W ^a  

^a UNIVERSITY OF LOUISVILLE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BUCKLING; ELASTIC MODULI; NANOFIBERS; SCANNING ELECTRON MICROSCOPY;

CALIBRATION PROCEDURES; FORCE SENSINGS; METALLIC NANOWIRES;

NANOWIRES;

NANOFIBER; NANOWIRE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CALIBRATION; NANOSENSOR; NEEDLE; PRIORITY JOURNAL; SCANNING ELECTROCHEMICAL MICROSCOPY; YOUNG MODULUS;

EID: 38649132915     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/03/035502     Document Type: Article

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