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Volumn 516, Issue 8, 2008, Pages 1952-1960

Nanomechanical properties of polymer thin films measured by force-distance curves

Author keywords

Atomic force microscopy; Indentation; Polymer thin films; Young's modulus

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; INDENTATION; NANOMECHANICS; POLYMETHYL METHACRYLATES; SUBSTRATES;

EID: 38649107699     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.09.042     Document Type: Article
Times cited : (46)

References (25)
  • 4
    • 0003563326 scopus 로고    scopus 로고
    • Decher G., and Schlenoff J.B. (Eds), Wiley-VCH, Weinheim
    • In: Decher G., and Schlenoff J.B. (Eds). Multilayer Thin Films (2003), Wiley-VCH, Weinheim
    • (2003) Multilayer Thin Films
  • 15
    • 83655200085 scopus 로고
    • Elvers B., Hawkins S., Ravenscroft M., Rounsaville J.F., and Schulz G. (Eds), Wiley-VCH, Weinheim
    • In: Elvers B., Hawkins S., Ravenscroft M., Rounsaville J.F., and Schulz G. (Eds). Ullmann's Encyclopedia of Industrial Chemistry vol. A 12 (1989), Wiley-VCH, Weinheim 386
    • (1989) Ullmann's Encyclopedia of Industrial Chemistry , vol.A 12 , pp. 386
  • 25
    • 38649118322 scopus 로고    scopus 로고
    • B. Cappella, D. Silbernagl, Langmuir (to be published).
    • B. Cappella, D. Silbernagl, Langmuir (to be published).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.