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Volumn 516, Issue 8, 2008, Pages 1952-1960
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Nanomechanical properties of polymer thin films measured by force-distance curves
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Author keywords
Atomic force microscopy; Indentation; Polymer thin films; Young's modulus
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ELASTIC MODULI;
INDENTATION;
NANOMECHANICS;
POLYMETHYL METHACRYLATES;
SUBSTRATES;
HERTZ THEORY;
MECHANICAL DOUBLE-LAYERS;
POLYMER FILMS;
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EID: 38649107699
PISSN: 00406090
EISSN: None
Source Type: Journal
DOI: 10.1016/j.tsf.2007.09.042 Document Type: Article |
Times cited : (46)
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References (25)
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