Admittance spectroscopic analysis of organic light emitting diodes with the CFX plasma treatment on the surface of indium tin oxide anodes

Thin Solid Films

Volumn 516, Issue 7, 2008, Pages 1370-1373

  Park, Hyungjun ^a   Kim, Hyunmin ^a   Lee, Jeoungin ^a   Lee, Kwangsoo ^a   Yi, J ^a   Oh, Semyoung ^b   Sohn, Sunyoung ^b   Jung, Donggeun ^b   Jang, Sungi ^a   Chae, Heeyeop ^a  

^a Sungkyunkwan University   (South Korea)

^b Institute for Basic Science   (South Korea)

Author keywords

Admittance spectroscopy; Barrier height; CFX treatment; Organic light emitting diodes

Indexed keywords

ANODES; CHARGE INJECTION; ELECTRIC ADMITTANCE; PLASMA THEORY; RESISTORS; SEMICONDUCTING INDIUM COMPOUNDS; SURFACE TREATMENT; TIN OXIDES;

ADMITTANCE SPECTROSCOPY; BARRIER HEIGHTS; BULK RESISTANCE; PLASMA SURFACE TREATMENT;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 38649093374     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2007.07.178     Document Type: Article

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