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Optics Letters

Volumn 32, Issue 21, 2007, Pages 3062-3064

Thin-film-based sensitivity enhancement for total internal reflection fluorescence live-cell imaging

(4) Kim, Kyujung a Cho, Eun Jin a,b Huh, Yong Min a,b Kim, Donghyun a

a Yonsei University (South Korea)

b Yonsei University College of Medicine (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM OXIDE; GLASS; MICROSPHERE; SILICON DIOXIDE;

ARTICLE; CARCINOMA; FLUORESCENCE; FLUORESCENCE MICROSCOPY; HUMAN; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; PATHOLOGY; RADIATION SCATTERING; SENSITIVITY AND SPECIFICITY; TUMOR CELL LINE;

ALUMINUM OXIDE; CARCINOMA; CELL LINE, TUMOR; FLUORESCENCE; GLASS; HUMANS; IMAGE ENHANCEMENT; MICROSCOPY, FLUORESCENCE; MICROSPHERES; SCATTERING, RADIATION; SENSITIVITY AND SPECIFICITY; SILICON DIOXIDE;

FIELD INTENSITY ENHANCEMENT; LIVE-CELL IMAGING;

DIELECTRIC FILMS; FLUORESCENCE; SEMICONDUCTOR QUANTUM DOTS; THIN FILMS;

IMAGE ENHANCEMENT;

EID: 38449116515 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.32.003062 Document Type: Article

Times cited : (16)

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