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Volumn 556-557, Issue , 2007, Pages 513-516
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Etching of 4° and 8° 4h-sic using various hydrogen-propane mixtures in a commercial hot-wall cvd reactor
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Author keywords
Hot wall chemical vapor deposition; Hydrogen propane etching; Off oriented; Step bunching; Surface morphology
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
ETCHING;
GROWTH TEMPERATURE;
HYDROGEN;
PROPANE;
SILICON CARBIDE;
SUBSTRATES;
SURFACE MORPHOLOGY;
4H-SIC SUBSTRATE;
HOT WALL CHEMICAL VAPOR DEPOSITION;
HYDROGEN ETCHING;
NOMARSKI MICROSCOPY;
OFF-ORIENTED;
PROPANE MIXTURES;
STEP BUNCHING;
SURFACE DAMAGES;
MORPHOLOGY;
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EID: 38449109044
PISSN: 02555476
EISSN: 16629752
Source Type: Book Series
DOI: 10.4028/www.scientific.net/MSF.556-557.513 Document Type: Conference Paper |
Times cited : (13)
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References (9)
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